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Biotechnology Research Abstracts from the Biotechnology, Breeding and Seed Systems conference


RAPD, SSR and AFLP markers linked to genes conferring resistance to angular leaf spot in common bean

G. Mahuku, C. Montoya, Y. Mantilla, M. Contreras, C. Jara & S. Beebe

Angular leaf spot of common bean, caused by the fungus, Phaeoisaiopsis griseola Sacc., is a major disease that can cause yield losses as high as 80%. Host resistance is the most practical strategy to manage the disease but resistant cultivars are short-lived because P. griseola is highly variable. Pyramiding resistance genes is a very effective way to develop cultivars with lasting resistance but combining several resistance genes simultaneously in one background is impossible without markers (either physical or molecular) for each gene. The objectives of this study were to determine the inheritance of angular leaf spot resistance and identify random amplified fragment length polymrphism (RAPDs), simple sequence repeats (SSR) and amplified fragment length polymorphism (AFLP) markers linked to the resistance genes present in three genotypes: Mexico 54, MAR 1 and G 10474. Greenhouse evaluations of parents, F1, F2 and backcross-derived plants showed that ALS resistance in Mexico 54 to race 31-55 and of G 10474 to race 63-63 was conditioned by a single dominant gene. Evaluation of parents, F2 and recombinant inbred lines (RILs) derived from crossing MAR1 x VAX 6 revealed that ALS resistance in MAR 1 to races 31-55, 63-23 and 31-39 was conditioned by a single dominant gene. The gene in Mexico 54 was tightly linked to the RAPD marker OPE4700 and three potential AFLP markers E-AAG/M-CAA330, E-ACG/M-CTC310 and E-ACT/M-CAT260. The resistance gene in MAR 1 segregated with the SSR marker (GT)n 230, while three AFLP fragments E-AAC/M-CAG310, E-ACA/M-CTT330 and E-AAC/M-CAT285 segregated with the resistance gene in G 10474. The utility of these markers in different common bean backgrounds, development of sequence characterised amplified region (SCAR) markers and their usefulness in marker assisted selection in breeding to pyramid angular leaf spot resistance genes into commercial types of common bean is discussed.  


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