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Distribution of angular leaf spot of common bean in Kenya and virulence diversity of the causal agent, Phaeoisariopsis griseola (Sacc.) Ferr.

 I.N. Wagara, A.W. Mwangómbe, J.W. Kimenju & R.A. Buruchara

Angular leaf spot, caused by Phaeoisariopsis griseola (Sacc.) Ferr., is among the most important diseases of common bean (Phaseolus vulgaris) in Kenya, causing yield losses of up to 80%. When weather conditions are favourable, the disease can be very destructive with most crop losses resulting from premature defoliation. Breeding for resistance to this disease is complicated by wide pathogenic variation within the causal agent.   A survey conducted to determine prevalence, incidence and severity of angular leaf spot revealed that the disease is widely distributed in Kenya. The disease was prevalent in all the five districts surveyed and disease incidence and severity were generally high. Fifty-three percent of the farms visited had mean disease incidence of more than 50%, and 29% of the farms had average severity scores of over 25%. P. griseola was isolated from infected bean leaves collected from randomly selected fields and the extent of virulence diversity in the pathogen population determined by inoculating 12 bean varieties. Based on their virulence reactions on the differential varieties, 100 isolates of the pathogen were grouped into 44 races. Eight of the races exclusively infected large-seeded bean varieties and were therefore categorised as Andean. Twenty-nine races were of the Mesoamerican group that infects both the large- and small-seeded varieties, and 7 races belonged to the Afro-Andean group. These results indicate a wide pathogenic variability in the angular leaf spot pathogen that must be taken into consideration when developing and selecting bean varieties with resistance to P. griseola.